Technical Program

Paper Detail

Paper Title FROM PATCHES TO DEEP LEARNING: COMBINING SELF-SIMILARITY AND NEURAL NETWORKS FOR SAR IMAGE DESPECKLING
Paper IdentifierWE3.R1.4
Authors Loïc Denis, Université de Lyon, France; Charles-Alban Deledalle, CNRS, France; Florence Tupin, Télécom Paristech, France
Session Non Local SAR Paradigm: New Methods and Applications I
Location Room 211-212
Session Time Wednesday, 31 July, 14:40 - 15:20
Presentation Time Wednesday, 31 July, 14:40 - 15:00
Presentation Mode Oral
Topic Invited Sessions: Non Local SAR paradigm: new methods and applications